NSLS BEAMLINE X26C

X-ray Diffraction Data Collection for Microcrystals. J. Pluth, L. Clark , S. Sutton (U. of Chicago), M. Helliwell (U. of Manchester), G. Harlow (Am. Museum of Nat. Hist.), and G. Shea-McCarthy (U. of Chicago).. 1996: NSLS Beamline X26C.
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Real-Time Electromigration Strain Measurement on Individual Al Interconnect Lines by White Beam Microdiffraction. G. S. Cargill III and P.-C. Wang, Columbia University, and I. C. Noyan, E. G. Liniger, C.-K. Hu and K. Y. Lee, IBM Research. 1996: NSLS Beamline X26C.
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Characterization of Defects in Protein Crystals by Diffractometry and Topography. V. Stojanoff (ESRF), D. P. Siddons (NSLS), E. Snell (NASA), T. Boggon and J. R. Helliwell (U. Manchester, UK.).. 1996: NSLS Beamline X26C.
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Fabrication of a mm-Wave Accelerating Cavity, Using Deep X-ray Lithography. J.J. Song, Y.W. Kang, R.L. Kustom, B. Lai, D.C. Mancini, A. Nassiri (ANL), and V. White (U. Wisconsin ). 1996: NSLS Beamline X26C.
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