NSLS BEAMLINE X23A3

Polishing Effects in Single-crystal Sapphire. David Black, Harold Burdette (NIST) and Frederick Schmid (Crystal Systems). 1996: NSLS Beamline X23A3.
HTML, PDF 20623 bytes.

Surface Defects and Fracture of Sapphire Single Crystals. David Black, Harold Burdette (NIST) and Dan Harris (NAWC). 1996: NSLS Beamline X23A3.
HTML, PDF 22303 bytes.
In situ X-ray Diffraction Imaging of Electrically Fixed Photorefractive Holograms in Barium Titanate. G. Fogarty, B. Steiner (NIST), M. H. Garrett, J. Martin, and R. Uhrin (Deltronic Crystal Ind.). 1996: NSLS Beamline X23A3.
HTML, PDF 33337 bytes.
X-ray Diffraction Imaging of Electrically Fixed Holograms in Strontium Barium Niobate (SBN). G. Fogarty, B. Steiner (NIST), T. Chang, and J. Hong (Rockwell International). 1996: NSLS Beamline X23A3.
HTML, PDF 31579 bytes.
In situ Measurements of Dislocation Structure Evolution in Al Single Crystals Deformed in Tension. L. E. Levine (WSU), G. G. Long, D. R. Black and Robb Thomson (NIST). 1996: NSLS Beamline X23A3.
HTML, PDF 30015 bytes.
Crack Correlation in Tensilely Strained Multifilamentary High-Tc Superconductor Composite Tapes. R. D. Spal (NIST), G. N. Riley and C. J. Christopherson (American Superconductor Corp.). 1996: NSLS Beamline X23A3.
HTML, PDF 30077 bytes.
Residual Disorder in Low Pressure, Low Thermal Gradient LEC Gallium Arsenide Observed in High Resolution Diffraction Imaging. B. Steiner, L.E. Levine (NIST), M. Brown, and D. Larson (Grumman). 1996: NSLS Beamline X23A3.
HTML, PDF 44537 bytes.